Scientific Instrumentation

  Atomic force microscopy device Copyright: © AK Simon

For characterization we use following scientific instrumentation in our research group.

Contact

Michael Noyong © Copyright: Martin Braun

Name

Michael Noyong

Coordinator Research and Teaching

Phone

work
+49 241 80 99683

Email

E-Mail
 

Electrical measurements

  • Electrical transport measurements
 

Nanostructure analysis

  • Atomic force microscope
  • Particlesizer/dynamic light scattering
  • Scanning electron microscopy
  • Transmission electron microscopy
 

Spectroscopy

  • Energy dispersive X-ray spectroscopy
  • FT infrared spectroscopy
  • UV/Vis spectroscopy
  • X-ray fluorescence spectroscopy
 

Other equipment

  • Contact angle measurement
  • Light microscopy